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Energy Transfer from Quantum Dots to Graphene and MoS 2 : The Role of Absorption and Screening in Two-Dimensional Materials

Raja, Archana ; Montoya−Castillo, Andrés ; Zultak, Johanna ; Zhang, Xiao-Xiao ; Ye, Ziliang ; Roquelet, Cyrielle ; Chenet, Daniel A ; van Der Zande, Arend M ; Huang, Pinshane ; Jockusch, Steffen ; Hone, James ; Reichman, David R ; Brus, Louis E ; Heinz, Tony F ; Slac National Accelerator Lab., Menlo Park, Ca (United States) (Corporate Author)

Nano Letters, 13 April 2016, Vol.16(4) [Rivista Peer Reviewed]

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Clean Graphene Electrodes on Organic Thin-Film Devices via Orthogonal Fluorinated Chemistry

Beck, Jonathan H ; Barton, Robert A ; Cox, Marshall P ; Alexandrou, Konstantinos ; Petrone, Nicholas ; Olivieri, Giorgia ; Yang, Shyuan ; Hone, James ; Kymissis, Ioannis ; Energy Frontier Research Centers (Efrc) (United States). Re-Defining Photovoltaic Efficiency Through Molecule Scale Control (Rpemsc) (Corporate Author)

Nano Letters, 08 April 2015, Vol.15(4) [Rivista Peer Reviewed]

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Direct Measurement of the Tunable Electronic Structure of Bilayer MoS 2 by Interlayer Twist

Yeh, Po-Chun ; Jin, Wencan ; Zaki, Nader ; Kunstmann, Jens ; Chenet, Daniel ; Arefe, Ghidewon ; Sadowski, Jerzy T ; Dadap, Jerry I ; Sutter, Peter ; Hone, James ; Osgood, Richard M ; Energy Frontier Research Centers (Efrc) (United States). Re-Defining Photovoltaic Efficiency Through Molecule Scale Control (Rpemsc) (Corporate Author)

Nano Letters, 10 February 2016, Vol.16(2) [Rivista Peer Reviewed]

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Epitaxially Self-Assembled Alkane Layers for Graphene Electronics

Yu, Young-Jun ; Lee, Gwan-Hyoung ; Choi, Ji Il ; Shim, Yoon Su ; Lee, Chul-Ho ; Kang, Seok Ju ; Lee, Sunwoo ; Rim, Kwang Taeg ; Flynn, George W ; Hone, James ; Kim, Yong-Hoon ; Kim, Philip ; Nuckolls, Colin ; Ahn, Seokhoon ; Energy Frontier Research Centers (Efrc) (United States). Re-Defining Photovoltaic Efficiency Through Molecule Scale Control (Rpemsc) (Corporate Author)

Advanced Materials, 01 December 2016, Vol.29(5) [Rivista Peer Reviewed]

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Graphene-Assisted Antioxidation of Tungsten Disulfide Monolayers: Substrate and Electric-Field Effect

Kang, Kyungnam ; Godin, Kyle ; Kim, Young Duck ; Fu, Shichen ; Cha, Wujoon ; Hone, James ; Yang, Eui-Hyeok

Advanced Materials, 24 February 2017, Vol.29(18) [Rivista Peer Reviewed]

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Heterostructures based on inorganic and organic van der Waals systems

Lee, Gwan-Hyoung ; Lee, Chul-Ho ; Zande, Arend M. van Der ; Han, Minyong ; Cui, Xu ; Arefe, Ghidewon ; Hone, James ; Nuckolls, Colin ; Heinz, Tony F ; Department of Physics, Columbia University, New York, New York 10027 ; Kim, Philip

APL Materials, 01 September 2014, Vol.2(9) [Rivista Peer Reviewed]

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Cells test substrate rigidity by local contractions on submicrometer pillars

Ghassemi, Saba ; Meacci, Giovanni ; Liu, Shuaimin ; Gondarenko, Alexander A. ; Mathur, Anurag ; Roca-Cusachs, Pere ; Sheetz, Michael P. ; Hone, James

Proceedings of the National Academy of Sciences of the United States of America, 3 April 2012, Vol.109(14), pp.5328-5333 [Rivista Peer Reviewed]

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Low-Voltage Organic Electronics Based on a Gate-Tunable Injection Barrier in Vertical graphene-organic Semiconductor Heterostructures

Hlaing, Htay ; Kim, Chang-Hyun ; Carta, Fabio ; Nam, Chang-Yong ; Barton, Rob A ; Petrone, Nicholas ; Hone, James ; Kymissis, Ioannis ; Energy Frontier Research Centers (Efrc) (United States). Re-Defining Photovoltaic Efficiency Through Molecule Scale Control (Rpemsc) (Corporate Author)

Nano Letters, 22 December 2014, Vol.15(1) [Rivista Peer Reviewed]

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The role of feature curvature in contact guidance

Mathur, Anurag ; Moore, Simon W ; Sheetz, Michael P ; Hone, James

Acta Biomaterialia, July 2012, Vol.8(7), pp.2595-2601 [Rivista Peer Reviewed]

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Ambipolar Landau levels and strong band-selective carrier interactions in monolayer WSe2

Gustafsson, Martin V ; Yankowitz, Matthew ; Forsythe, Carlos ; Rhodes, Daniel ; Watanabe, Kenji ; Taniguchi, Takashi ; Hone, James ; Zhu, Xiaoyang ; Dean, Cory R ; Columbia Univ., New York, Ny (United States) (Corporate Author)

Nature Materials, 26 March 2018, Vol.17(5) [Rivista Peer Reviewed]

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