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ETS 2009 : European Test Symposium : proceedings, 25-29 May, 2009, Sevilla, Spain
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ETS 2009 : European Test Symposium : proceedings, 25-29 May, 2009, Sevilla, Spain

IEEE European Test Symposium Corporate Author ; IEEE Computer Society Content Provider; Institute of Electrical and Electronics Engineers Content Provider; IEEE European Test Symposium

Place of publication not identified IEEE Computer Society ; 2009

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2
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EMLC 2007 : 23rd European Mask and Lithography Conference : 22-25 January 2007, Grenoble, France

European Mask and Lithography Conference Corporate Author ; Maurer, Wilhelm Contributor; Waelpoel, Jacques. Contributor; Behringer, Uwe F. W Contributor; Society of Photo Optical Instrumentation Engineers Content Provider

Place of publication not identified SPIE ; 2007

Accesso online

3
2010 23rd International Conference on VLSI Design: Concurrently with the 9th International Conference on Embedded Systems Design
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2010 23rd International Conference on VLSI Design: Concurrently with the 9th International Conference on Embedded Systems Design

International Conference on VLSI Design Corporate Author ; IEEE Electron Devices Society Content Provider; ACM Special Interest Group on Design Automation Content Provider; India Content Provider; VLSI Society of India Content Provider; Institute of Electrical and Electronics Engineers Content Provider; IEEE Circuits and Systems Society Content Provider; International Conference on VLSI Design

Place of publication not identified IEEE ; 2010

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4
ETS 2007 : 12th IEEE European Test Symposium : proceedings : 20-24 May, 2007, Freiburg, Germany
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ETS 2007 : 12th IEEE European Test Symposium : proceedings : 20-24 May, 2007, Freiburg, Germany

European Test Workshop Corporate Author ; IEEE Computer Society Technical Council on Test Technology. Content Provider; European Test Workshop

Place of publication not identified IEEE Computer Society Press ; 2007

Accesso online

5
2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009
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2009 27th IEEE VLSI Test Symposium : proceedings : 3-7 May 2009 Santa Cruz, CA, USA ; VTS 2009

IEEE VLSI Test Symposium Corporate Author ; Institute of Electrical and Electronics Engineers Content Provider; IEEE Computer Society Test Technology Technical Committee Content Provider; IEEE VLSI Test Symposium

Place of publication not identified IEEE Computer Society ; 2009

Accesso online

6
PRIME, 2008 PhD research in microelectronics and electronics : proceedings : Istanbul, Turkey, June 22-25, 2008
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PRIME, 2008 PhD research in microelectronics and electronics : proceedings : Istanbul, Turkey, June 22-25, 2008

PRIME Conference Corporate Author ; Institute of Electrical and Electronics Engineers Content Provider; École polytechnique fédérale de Lausanne Content Provider; PRIME Conference

Place of publication not identified IEEE ; 2008

Accesso online

7
Proceedings : Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy
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Proceedings : Thirteenth IEEE European Test Symposium : ETS 2008, 25-29 May 2008, Verbania, Italy

IEEE European Test Symposium Corporate Author ; IEEE Computer Society Content Provider; IEEE European Test Symposium

Place of publication not identified Conference Pub Services ; 2008

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8
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IFIP VLSI-SoC 2006 : IFIP WG 10.5 International Conference on Very Large Scale Integration & System-on-Chip : Nice, France, October 16-18, 2006

IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration Corporate Author ; Mir, Salvador Contributor; TIMA Laboratory Content Provider; IFIP TC 10/WG 10.5 International Conference on Very Large Scale Integration

Place of publication not identified TIMA Laboratory ; 2007

Accesso online

9
22nd International Conference on VLSI Design : held jointly with 8th International Conference on Embedded Systems : proceedings : New Delhi, India, 5-9 January 2009
Material Type:
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22nd International Conference on VLSI Design : held jointly with 8th International Conference on Embedded Systems : proceedings : New Delhi, India, 5-9 January 2009

International Conference on VLSI Design Corporate Author ; VLSI Society of India Content Provider; IEEE Circuits and Systems Society Content Provider; International Conference on VLSI Design

Place of publication not identified IEEE Computer Society ; 2009

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10
2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan
Material Type:
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2007 IEEE International Conference on Microelectronic Test Structures : ICMTS : conference proceedings : March 19-22, Takeda Hall, The University of Tokyo, Japan

IEEE International Conference on Microelectronic Test Structures Corporate Author ; IEEE Xplore (Online service) Content Provider; IEEE Electron Devices Society Content Provider; IEEE International Conference on Microelectronic Test Structures

Place of publication not identified IEEE ; 2007

Accesso online

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  1. Riviste Peer-reviewed (20.944)
  2. Risorse online (26.964)

Argomento 

  1. Engineering 
  2. components, circuits, devices and systems 
  3. (An) 
  4. Electronic Components and Materials (Ea) 
  5. Physics 
  6. Silicon 
  7. Computer-aided design 
  8. Cmos 
  9. Transistors 
  10. Computer Science 
  11. Integrated circuits–Design and construction 
  12. Electronics 
  13. Semiconductors 
  14. Integrated circuits–Research 
  15. Signal processing 
  16. Microprocessors 
  17. Electrical engineering 
  18. Microelectronics 
  19. Radio frequency 
  20. Electronic circuits 
  21. Electronic Components 
  22. Mosfet (Transistors) 
  23. Digital integrated circuits 
  24. Photonics 
  25. Engineering Sciences 
  26. Printed circuits 
  27. Image processing 
  28. Computers 
  29. Integrierter Schaltkreis 
  30. Chemistry 
  31. Integrated circuits–Testing 
  32. Nanotechnology 
  33. Microelectromechanical systems 
  34. Engineering & Applied Sciences 
  35. Electrical & Computer Engineering 
  36. Polymers 
  37. Optoelectronic devices 
  38. Biology 
  39. Microcomputers 
  40. Digital electronics 
  41. Electrostatics 
  42. Telecommunications 
  43. Power electronics 
  44. Electronic systems 
  45. Computer engineering 
  46. Computer software 
  47. Electronic packaging 
  48. Computer programming 
  49. Passive components 
  50. Control theory 
  51. Linear integrated circuits 
  52. Digital-to-analog converters 
  53. Asynchronous circuits 
  54. Integrated circuits–Congresses 
  55. Embedded computer systems 
  56. Integrated circuits–Very large scale integration 
  57. Multimedia systems 
  58. Thin film devices 
  59. Computer systems 
  60. Very high speed integrated circuits 
  61. Computer security 
  62. Automatic test equipment 
  63. Mobile communication systems 
  64. Silicon alloys 
  65. Space vehicles 
  66. Electronic digital computers 
  67. Solid State Electronics 
  68. Electric power systems 
  69. Telecommunication 
  70. Germanium alloys 
  71. Integrated circuits–Reliability 
  72. Integrated circuits–Thermal properties 
  73. Wireless communication systems 
  74. Integrated circuits–Computer-aided design 
  75. Heat 
  76. Electronic circuit design 
  77. Integrated circuits–Verification 
  78. Microelectronic packaging 
  79. Metal oxide semiconductors, Complementary 
  80. Mixed signal circuits 
  81. Fault-tolerant computing 
  82. Integrated circuits–Materials 
  83. Nanostructured materials 
  84. System design 
  85. Electronic apparatus and appliances 
  86. Integrated circuits–Defects 
  87. Integrated circuits–Effect of radiation on 
  88. Radio frequency integrated circuits 
  89. Amorphous semiconductors 
  90. Iddq testing 
  91. Systems on a chip 
  92. Formal methods (Computer science) 
  93. Software localization 
  94. Neural networks (Computer science) 
  95. Telecommunication systems 
  96. Integrated circuits–Large scale integration 
  97. Radio circuits 
  98. Integrated circuits–Wafer-scale integration 
  99. Integrated circuits–Ultra large scale integration 
  100. Parallel processing (Electronic computers) 
  101. Static eliminators 
  102. Integrated circuits–Quality control 
  103. Speech processing systems 
  104. Integrated circuits–Protection 
  105. Polymeric composites 
  106. Agile software development 
  107. Integrated circuits–Periodicals 
  108. Electronic security systems 
  109. VHDL (Computer hardware description language) 
  110. Integrated circuits–Masks 
  111. Integrated circuits–Data processing 
  112. Altre opzioni open sub menu

Autore 

  1. IEEE Electron Devices Society 
  2. Institute of Electrical and Electronics Engineers 
  3. De Man, H 
  4. IEEE Circuits and Systems Society 
  5. IEEE Computer Society 
  6. International Conference on VLSI Design 
  7. Boyer, A. 
  8. VLSI Society of India 
  9. Boyer, Alexandre 
  10. Ben Dhia, Sonia 
  11. Zhang, Bo 
  12. Baets, Roel 
  13. Girard, Patrick 
  14. IEEE Computer Society Test Technology Technical Committee 
  15. Nee, Hans-Peter 
  16. International Test Conference 
  17. IEEE Computer Society Technical Council on Test Technology 
  18. Ilves, Kalle 
  19. Ghibaudo, Gerard 
  20. Zetterling, Carl-Mikael 
  21. Wimer, Shmuel 
  22. India 
  23. Harnefors, Lennart 
  24. Norrga, Staffan 
  25. IEEE Xplore (Online service) 
  26. Brodersen, Robert W 
  27. Zhang, Li 
  28. IEEE Reliability Society 
  29. Institute of Electrical and Electronics Engineers Philadelphia Section 
  30. International Integrated Reliability Workshop 
  31. International Symposium on the Physical & Failure Analysis of Integrated Circuits 
  32. India Department of Electronics 
  33. Gupta, Mridula 
  34. Saxena, Manoj 
  35. Antonopoulos, Antonios 
  36. International Symposium on Quality Electronic Design 
  37. Asia and South Pacific Design Automation Conference 
  38. Tu, K. N 
  39. Lubaszewski, Marcelo 
  40. IEEE Computer Society Technical Committee on VLSI 
  41. DeWeerth, Stephen P 
  42. European Solid State Circuits Conference 
  43. Huang, Ru 
  44. Rodriguez, Saul 
  45. Symposium on Integrated Circuits and Systems Design 
  46. IEEE Nuclear and Plasma Sciences Society 
  47. IEEE Radiation Effects Data Workshop 
  48. IEEE Reliability/CPMT/ED Singapore Chapter 
  49. Components, Packaging & Manufacturing Technology Society 
  50. IEEE Microwave Theory and Techniques Society 
  51. International Workshop on Junction Technology 
  52. IEEE European Test Symposium 
  53. Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems 
  54. Gong ye ji shu yan jiu yuan 
  55. Zhongguo dian zi xue hui 
  56. IEEE International Conference on Global Software Engineering 
  57. Sociedade Brasileira de Computaðcäao 
  58. Radhakrishnan, M. K 
  59. Southwest Symposium on Mixed-Signal Design 
  60. ACM Special Interest Group on Design Automation 
  61. IEEE Solid-State Circuits Society 
  62. IEEE International Conference on Microelectronic Test Structures 
  63. IEEE Signal Processing Society 
  64. Reis, Ricardo A. L 
  65. Smailagic, Asim 
  66. Kim, Sungdong 
  67. Oyo Butsuri Gakkai 
  68. Yugoslavia IEEE Section Electron Devices Chapter 
  69. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 
  70. International Workshop on Microprocessor Test and Verification 
  71. Someya, Takao 
  72. International Conference on Microelectronics 
  73. IEEE Computer Society Workshop on VLSI 
  74. Tung, Chih-Hang 
  75. International Conference on Solid-State and Integrated Circuit Technology 
  76. IEEE European Test Workshop 
  77. Zhong, Lei 
  78. IEEE CPMT Conference on High Density Microsystem Design and Packaging and Component Failure Analysis 
  79. IEEE Circuits and Systems Society Region 8 
  80. NASA Glenn Research Center 
  81. International Caribbean Conference on Devices, Circuits, and Systems 
  82. Denshi Joho Tsushin Gakkai (Japan) 
  83. Synopsys (Firm) 
  84. Institution of Electrical Engineers Electronics Division 
  85. IEEE International Conference on Computer Design 
  86. Castro Alves, Vladimir 
  87. TENCON 
  88. PRIME Conference 
  89. Rally Software (Firm) 
  90. International Conference on Integrated Circuit Design and Technology 
  91. IEEE Asia-Pacific Conference on Circuits and Systems 
  92. International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics 
  93. IEEE International Symposium on Circuits and Systems 
  94. American Vacuum Society 
  95. IEEE International Workshop on Defect Based Testing 
  96. University of Arizona Mixed-Signal Design Consortium 
  97. IEEE Radio Frequency Integrated Circuits Symposium 
  98. VDAT (Symposium) 
  99. Conference on Advanced Research in VLSI 
  100. International IEEE-NEWCAS Conference 
  101. IEEE Computer Society Fault-Tolerant Computing Technical Committee 
  102. INDICON (Conference) 
  103. Georgia Institute of Technology 
  104. Agile Conference 
  105. National University of Singapore 
  106. Chim, Wai Kin 
  107. IEEE Workshop on Signal Processing Systems Design and Implementation 
  108. IEEE Computer Society Design Automation Technical Committee 
  109. Ho, Philip 
  110. Association for Computing Machinery-Digital Library 
  111. Mahapatra, Souvik 
  112. Sociedade Brasileira de Computação 
  113. Menon, Sankaran M 
  114. Institute of Electrical and Electronics Engineers Central Texas Section 
  115. Institute of Electrical and Electronics Engineers. India Council 
  116. Electronics Systemintegration Technology Conference 
  117. Guo jia ke xue wei yuan hui 
  118. Koch, Rudolf 
  119. IEEE, Circuits and Systems Society Staff 
  120. Ecole polytechnique fédérale de Lausanne 
  121. Altre opzioni open sub menu

Anno 

Da A
  1. Prima1963 
  2. 1963a1976 
  3. 1977a1990 
  4. 1991a2005 
  5. Dopo 2005 
  6. Altre opzioni open sub menu

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